Tra cứu Tiêu chuẩn quốc tế
Tìm thấy 1241 kết quả.
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| 1201 |
DIN SPEC 45660-1Guide for handling uncertainty in acoustics and vibration - Part 1: Uncertainty of acoustical quantities Guide for handling uncertainty in acoustics and vibration - Part 1: Uncertainty of acoustical quantities |
| 1202 |
DIN SPEC 45674Human exposure to mechanical vibration - Knowledge for performing and evaluation of measurements Human exposure to mechanical vibration - Knowledge for performing and evaluation of measurements |
| 1203 |
DIN SPEC 50300Measuring geometries for assessing the night visibility of retroreflective materials with respect to the retroreflective properties Measuring geometries for assessing the night visibility of retroreflective materials with respect to the retroreflective properties |
| 1204 |
DIN CLC/TR 50510*DIN SPEC 40510Fibre optic access to end-user - A guideline to building of FTTx fibre optic network; German version CLC/TR 50510:2012 Fibre optic access to end-user - A guideline to building of FTTx fibre optic network; German version CLC/TR 50510:2012 |
| 1205 |
DIN SPEC 51458Testing of lubricants - Analysis of used greases - Requirements and test methods Testing of lubricants - Analysis of used greases - Requirements and test methods |
| 1206 |
DIN CEN ISO/TR 52022-2*DIN SPEC 4432Energy performance of buildings - Thermal, solar and daylight properties of building components and elements - Part 2: Explanation and justification (ISO/TR 52022-2:2017); German version CEN ISO/TR 52022-2:2017 Energy performance of buildings - Thermal, solar and daylight properties of building components and elements - Part 2: Explanation and justification (ISO/TR 52022-2:2017); German version CEN ISO/TR 52022-2:2017 |
| 1207 |
DIN SPEC 52407Nanotechnologies - Methods for preparation and assessment for particle measurements with atomic force microscopy (AFM) and transmission scanning electron microscopy (TSEM) Nanotechnologies - Methods for preparation and assessment for particle measurements with atomic force microscopy (AFM) and transmission scanning electron microscopy (TSEM) |
| 1208 |
DIN SPEC 55684Corrosion protection of steel structures by protective paint systems - Testing of surfaces before application of coating materials for containments that cannot be detected visually Corrosion protection of steel structures by protective paint systems - Testing of surfaces before application of coating materials for containments that cannot be detected visually |
| 1209 |
DIN SPEC 58193Spectacles and sunglasses - Critical substances potentially present in their materials Spectacles and sunglasses - Critical substances potentially present in their materials |
| 1210 |
DIN SPEC 58961Technical Report - Thrombocyte diagnostics Technical Report - Thrombocyte diagnostics |
| 1211 |
DIN IEC/TR 60146-1-2*DIN SPEC 48146-1-2Semiconductor converters - General requirements and line commutated converters - Part 1-2: Application guide (IEC/TR 60146-1-2:2011) Semiconductor converters - General requirements and line commutated converters - Part 1-2: Application guide (IEC/TR 60146-1-2:2011) |
| 1212 |
DIN IEC/TR 60493-3*DIN SPEC 40493-3Guidelines for the statistical analysis of ageing test data - Part 3: Minimum specimen numbers at different test conditions with given experimental data (IEC TR 60493-3:2017) Guidelines for the statistical analysis of ageing test data - Part 3: Minimum specimen numbers at different test conditions with given experimental data (IEC TR 60493-3:2017) |
| 1213 |
DIN IEC/TR 61292-9*DIN SPEC 40292Optical amplifiers - Part 9: Semiconductor optical amplifiers (SOAs) (IEC 86C/1109/CD:2013) Optical amplifiers - Part 9: Semiconductor optical amplifiers (SOAs) (IEC 86C/1109/CD:2013) |
| 1214 |
DIN IEC/TR 61858-3*DIN SPEC 41858-3Electrical insulation systems - Thermal evaluation of modifications to an established electrical insulation system (EIS) - Part 3: Clarification of EIM and auxiliary materials (IEC 112/410/CD:2017); Text in German and English Electrical insulation systems - Thermal evaluation of modifications to an established electrical insulation system (EIS) - Part 3: Clarification of EIM and auxiliary materials (IEC 112/410/CD:2017); Text in German and English |
| 1215 |
DIN IEC/TR 62343-6-2*DIN SPEC 42343-6-2Dynamic modules - Part 6-2: Software and hardware interfaces - Survey results (IEC 86C/1124/DTR:2013) Dynamic modules - Part 6-2: Software and hardware interfaces - Survey results (IEC 86C/1124/DTR:2013) |
| 1216 |
DIN IEC/TR 62343-6-4*DIN SPEC 42343-6-4Dynamic modules - Design guides - Part 6-4: Reconfigurable optical add/drop multiplexer (IEC 86C/1270/CD:2014) Dynamic modules - Design guides - Part 6-4: Reconfigurable optical add/drop multiplexer (IEC 86C/1270/CD:2014) |
| 1217 |
DIN CLC/TR 62541-1*DIN SPEC 43541-1OPC unified architecture - Part 1: Overview and concepts (IEC/TR 62541-1:2010); German version CLC/TR 62541-1:2010 OPC unified architecture - Part 1: Overview and concepts (IEC/TR 62541-1:2010); German version CLC/TR 62541-1:2010 |
| 1218 |
DIN IEC/TR 62572-4*DIN SPEC 40572-4Fibre optic active components and devices - Reliability - Part 4: Guideline for optical connector end-face cleaning methods for receptacle style optical transceivers (IEC 86C/1147/DTR:2013) Fibre optic active components and devices - Reliability - Part 4: Guideline for optical connector end-face cleaning methods for receptacle style optical transceivers (IEC 86C/1147/DTR:2013) |
| 1219 |
DIN IEC/TR 62627-01*DIN SPEC 42627-01Fibre optic interconnecting devices and passive components - Part 01: Fibre optic connector cleaning methods (IEC/TR 62627-01:2010) Fibre optic interconnecting devices and passive components - Part 01: Fibre optic connector cleaning methods (IEC/TR 62627-01:2010) |
| 1220 |
DIN IEC/TR 62632*DIN SPEC 42632Nanoscale electrical contacts and interconnects (IEC/TR 62632:2013) Nanoscale electrical contacts and interconnects (IEC/TR 62632:2013) |
