Tra cứu Tiêu chuẩn quốc tế
Tìm thấy 1241 kết quả.
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| 781 |
DIN IEC/TS 62564-1*DIN SPEC 42664-1Process management for avionics - Aerospace qualified electronic component (AQEC) - Part 1: Integrated circuits and discrete semiconductors (IEC/TS 62564-1:2011) Process management for avionics - Aerospace qualified electronic component (AQEC) - Part 1: Integrated circuits and discrete semiconductors (IEC/TS 62564-1:2011) |
| 782 |
DIN IEC/PAS 62565-2-1*DIN SPEC 40565-2-1Nanomanufacturing - Material specifications - Part 2-1: Single-wall carbon nanotubes - Blank detail specification (IEC/PAS 62565-2-1:2011) Nanomanufacturing - Material specifications - Part 2-1: Single-wall carbon nanotubes - Blank detail specification (IEC/PAS 62565-2-1:2011) |
| 783 |
DIN IEC/TS 62579*DIN SPEC 44579Multimedia home server systems - Conceptual model for domain management (IEC/TS 62579:2010) Multimedia home server systems - Conceptual model for domain management (IEC/TS 62579:2010) |
| 784 |
DIN IEC/TS 62607-2-1*DIN SPEC 42607-2-1Nanomanufacturing - Key control characteristics - Part 2-1: Carbon nanotube materials - Film resistance (IEC/TS 62607-2-1:2012) Nanomanufacturing - Key control characteristics - Part 2-1: Carbon nanotube materials - Film resistance (IEC/TS 62607-2-1:2012) |
| 785 |
DIN IEC/TS 62607-3-2*DIN SPEC 42607-3-2Nanomanufacturing - Key control characteristics - Part 3-2: Luminescent nanoparticles - Determination of mass of quantum dot dispersion (IEC/TS 62607-3-2:2017) Nanomanufacturing - Key control characteristics - Part 3-2: Luminescent nanoparticles - Determination of mass of quantum dot dispersion (IEC/TS 62607-3-2:2017) |
| 786 |
DIN IEC/TS 62607-4-1*DIN SPEC 42607-4-1Nanomanufacturing - Key control characteristics - Part 4-1: Cathode nanomaterials for nano-enabled electrical energy storage - Electrochemical characterisation, 2-electrode cell method (IEC/TS 62607-4-1:2015) Nanomanufacturing - Key control characteristics - Part 4-1: Cathode nanomaterials for nano-enabled electrical energy storage - Electrochemical characterisation, 2-electrode cell method (IEC/TS 62607-4-1:2015) |
| 787 |
DIN IEC/TS 62607-4-2*DIN SPEC 42607-4-2Nanomanufacturing - Key control characteristics - Part 4-2: Nano-enabled electrical energy storage - Physical characterization of cathode nanomaterials, density measurement (IEC/TS 62607-4-2:2016) Nanomanufacturing - Key control characteristics - Part 4-2: Nano-enabled electrical energy storage - Physical characterization of cathode nanomaterials, density measurement (IEC/TS 62607-4-2:2016) |
| 788 |
DIN IEC/TS 62607-4-3*DIN SPEC 42607-4-3Nanomanufacturing - Key control characteristics - Part 4-3: Nano-enabled electrical energy storage - Contact and coating resistivity measurements for nanomaterials (IEC/TS 62607-4-3:2015) Nanomanufacturing - Key control characteristics - Part 4-3: Nano-enabled electrical energy storage - Contact and coating resistivity measurements for nanomaterials (IEC/TS 62607-4-3:2015) |
| 789 |
DIN IEC/TS 62607-4-4*DIN SPEC 42607-4-4Nanomanufacturing - Key control characteristics - Part 4-4: Nano-enabled electrical energy storage devices - Thermal characterization of nanomaterials, nail penetration method (IEC 113/306/DTS:2016) Nanomanufacturing - Key control characteristics - Part 4-4: Nano-enabled electrical energy storage devices - Thermal characterization of nanomaterials, nail penetration method (IEC 113/306/DTS:2016) |
| 790 |
DIN IEC/TS 62607-4-5*DIN SPEC 42607-4-5Nanomanufacturing - Key control characteristics - Part 4-5: Cathode nanomaterials for nano-enabled electrical energy storage - Electrochemical characterisation, 3-electrode cell method (IEC 113/308/CD:2016) Nanomanufacturing - Key control characteristics - Part 4-5: Cathode nanomaterials for nano-enabled electrical energy storage - Electrochemical characterisation, 3-electrode cell method (IEC 113/308/CD:2016) |
| 791 |
DIN IEC/TS 62607-4-7*DIN SPEC 42607-4-7Nanomanufacturing - Key control characteristics - Part 4-7: Anode nanomaterials for nano-enabled electrical energy storage - Determination of magnetic impurities, ICP-OES method (IEC 113/405/DTS:2018); Text in German and English Nanomanufacturing - Key control characteristics - Part 4-7: Anode nanomaterials for nano-enabled electrical energy storage - Determination of magnetic impurities, ICP-OES method (IEC 113/405/DTS:2018); Text in German and English |
| 792 |
DIN IEC/TS 62607-5-1*DIN SPEC 42607-5-1Nanomanufacturing - Key control characteristics - Part 5-1: Thin-film organic/nano electronic devices - Carrier transport measurements (IEC/TS 62607-5-1:2014) Nanomanufacturing - Key control characteristics - Part 5-1: Thin-film organic/nano electronic devices - Carrier transport measurements (IEC/TS 62607-5-1:2014) |
| 793 |
DIN IEC/TS 62607-6-4*DIN SPEC 42607-6-4Nanomanufacturing - Key control characteristics - Part 6-4: Graphene - Conductance measurements using resonant cavity (IEC 113/269/CD:2015) Nanomanufacturing - Key control characteristics - Part 6-4: Graphene - Conductance measurements using resonant cavity (IEC 113/269/CD:2015) |
| 794 |
DIN IEC/TS 62622*DIN SPEC 42622Nanotechnologies - Description, measurement and dimensional quality parameters of artificial gratings (IEC/TS 62622:2012) Nanotechnologies - Description, measurement and dimensional quality parameters of artificial gratings (IEC/TS 62622:2012) |
| 795 |
DIN IEC/TS 62627-09*DIN SPEC 42627-09Fibre optic interconnecting devices and passive components - Terminology of passive optical devices (IEC 86B/3993/DTS:2016) Fibre optic interconnecting devices and passive components - Terminology of passive optical devices (IEC 86B/3993/DTS:2016) |
| 796 |
DIN IEC/TS 62647-1*DIN SPEC 42647-1Process management for avionics - Aerospace and defence electronic systems containing lead-free solder - Part 1: Preparation for a lead-free control plan (IEC/TS 62647-1:2012) Process management for avionics - Aerospace and defence electronic systems containing lead-free solder - Part 1: Preparation for a lead-free control plan (IEC/TS 62647-1:2012) |
| 797 |
DIN IEC/TS 62647-2*DIN SPEC 42647-2Process management for avionics - Aerospace and defence electronic systems containing lead-free solder - Part 2: Mitigation of deleterious effects of tin (IEC/TS 62647-2:2012) Process management for avionics - Aerospace and defence electronic systems containing lead-free solder - Part 2: Mitigation of deleterious effects of tin (IEC/TS 62647-2:2012) |
| 798 |
DIN IEC/TS 62647-3*DIN SPEC 42647-3Process management for avionics - Aerospace and defence electronic systems containing lead-free solder - Part 3: Performance testing for systems containing lead-free solder and finishes (IEC 107/213/DTS:2013) Process management for avionics - Aerospace and defence electronic systems containing lead-free solder - Part 3: Performance testing for systems containing lead-free solder and finishes (IEC 107/213/DTS:2013) |
| 799 |
DIN IEC/TS 62647-23*DIN SPEC 42647-23Process management for avionics - Aerospace and defence electronic systems containing lead free solder - Part 23: Rework and repair guidance to address the implications of lead-free electronics and mixed assemblies (IEC 107/206/DTS:2013) Process management for avionics - Aerospace and defence electronic systems containing lead free solder - Part 23: Rework and repair guidance to address the implications of lead-free electronics and mixed assemblies (IEC 107/206/DTS:2013) |
| 800 |
DIN IEC/TS 62661-2-1*DIN SPEC 42661-2-1Optical backplanes - Product specification - Part 2-1: Optical backplane using optical fibre circuit boards and multi-core right angle optical connectors (IEC 86/375/CD:2010) Optical backplanes - Product specification - Part 2-1: Optical backplane using optical fibre circuit boards and multi-core right angle optical connectors (IEC 86/375/CD:2010) |
